Contact and Bulk Resistivity Screening for Advanced c‐Si...

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Contact and Bulk Resistivity Screening for Advanced c‐Si Solar Cell Concepts by an Economical and Reliable Transfer Length Measurement Method Based on Laser Micro Patterning

Lange, Stefan, Hensel, Stephan, Hähnel, Angelika, Naumann, Volker, Urban, Tobias, Müller, Matthias, Hagendorf, Christian
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Journal:
physica status solidi (a)
DOI:
10.1002/pssa.202000520
Date:
November, 2020
File:
PDF, 559 KB
2020
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