Displacement Mapping During In-Situ Straining in the SEM

Microscopy and Microanalysis 1999 / 08 Vol. 5; Iss. S2

Displacement Mapping During In-Situ Straining in the SEM

Biery, Nicholas E., Pollock, Tresa M., Nuhfer, N.T., Graef, Marc De
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Volume:
5
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600014999
Date:
August, 1999
File:
PDF, 830 KB
1999
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