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Displacement Mapping During In-Situ Straining in the SEM
Biery, Nicholas E., Pollock, Tresa M., Nuhfer, N.T., Graef, Marc DeVolume:
5
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600014999
Date:
August, 1999
File:
PDF, 830 KB
1999