![](/img/cover-not-exists.png)
[IEEE 2020 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT) - Bangalore, India (2020.7.2-2020.7.4)] 2020 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT) - Simulation and Modelling of screen oxide thickness dependent implantation peak position in Silicon
Hegde, Gajanana R, Nikhil, Krishnannadar Savithry, Rao, RathnamalaYear:
2020
DOI:
10.1109/conecct50063.2020.9198502
File:
PDF, 385 KB
2020