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EXEELFS (Extended Electron Energy Loss Fine Structure) Study of Tin Grown by the DC Sputtering Technique.
A., Duarte-Moller, Espinosa-Maganña, F., MartÃnez-S´anchez, R., Contreras, O.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600033626
Date:
August, 2000
File:
PDF, 800 KB
2000