Direct Electron Exposed Silicon Detectors in EELS

Direct Electron Exposed Silicon Detectors in EELS

Orsholm, Claes, Csillag, Stefan
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Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S143192760003614X
Date:
August, 2000
File:
PDF, 1.27 MB
2000
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