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Chain Structure Defect Location by Focused Ion Beam Passive Voltage Contrast
Rossie, B.B., Shofner, T.L., Brown, S.R., Shuttleworth, D.M., Nguyen, D.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927600035091
Date:
August, 2000
File:
PDF, 2.45 MB
2000