Electrical Interface Characterisation of Ultrathin...

physica status solidi (a) 2020 / 11

Electrical Interface Characterisation of Ultrathin Amorphous Silicon Layers on Crystalline Silicon

Thoma, Patrick, Breyer, Evelyn Tina, Thoma, Oana-Maria, Salvan, Georgeta, Zahn, Dietrich R. T.
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Journal:
physica status solidi (a)
DOI:
10.1002/pssa.202000079
Date:
November, 2020
File:
PDF, 519 KB
2020
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