Electronic Structure Investigations of Metal / SrtiO 3 Interfaces Using EELS
van Benthem, Klaus, Scheu, Christina, Sigle, Wilfried, Elsässer, Christian, Rühle, ManfredVolume:
7
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927600027598
Date:
August, 2001
File:
PDF, 1.36 MB
2001