CPLD-Based Displacement Measurement System for Nanoscale...

Journal of Chemistry 2020 / 11 Vol. 2020

CPLD-Based Displacement Measurement System for Nanoscale Grating Ruler

Sun, Jiyuan, Tian, Chunlin, Jiao, Tifeng
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Volume:
2020
Journal:
Journal of Chemistry
DOI:
10.1155/2020/5142892
Date:
November, 2020
File:
PDF, 1.49 MB
2020
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