On the Atomic-Force Microscopy and Electrical Properties of...

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques 2020 / 09 Vol. 14; Iss. 5

On the Atomic-Force Microscopy and Electrical Properties of Single-Crystal Bismuth Films

Grabov, V. M., Gerega, V. A., Demidov, E. V., Komarov, V. A., Starytsin, M. V., Suslov, A. V., Suslov, M. V.
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Volume:
14
Journal:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
DOI:
10.1134/s1027451020050055
Date:
September, 2020
File:
PDF, 1023 KB
2020
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