Shoot-through protection for an inverter consisting of the next-generation IGBTs with gate impedance reduction
Hasegawa, K., Abe, S., Tsukuda, M., Omura, I., Ninomiya, T.Volume:
114
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2020.113765
Date:
November, 2020
File:
PDF, 1.38 MB
2020