Multiparametric analytical quantification of materials at...

Applied Surface Science 2021 / 01 Vol. 536

Multiparametric analytical quantification of materials at nanoscale in tapping force microscopy

Payam, Amir Farokh, Morelli, Alessio, Lemoine, Patrick
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Volume:
536
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2020.147698
Date:
January, 2021
File:
PDF, 1.80 MB
2021
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