Characterization of Dislocation Reactivity and Dynamics in...

Characterization of Dislocation Reactivity and Dynamics in Thin Metal Films Using Scanning Tunneling Microscopy

Hwang, R.Q.
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Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S143192760003600X
Date:
August, 2000
File:
PDF, 1.32 MB
2000
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