Evaluation and application of a new scintillatorâbased heatâresistant backâscattered electron detector during heat treatment in the scanning electron microscope
Podor, R., Mendonça, J., Lautru, J., Brau, H.P., Nogues, D., Candeias, A., Horodysky, P., Kolouch, A., Barreau, M., Carrier, X., Ramenatte, N., Mathieu, S., Vilasi, M.Journal:
Journal of Microscopy
DOI:
10.1111/jmi.12979
Date:
November, 2020
File:
PDF, 3.17 MB
2020
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