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Microscopy Research and Technique 2020 / 11

Application of aberration‐corrected scanning transmission electron microscopy in conjunction with valence electron energy loss spectroscopy for the nanoscale mapping of the elastic properties of Al–Li–Cu alloys

Khushaim, Muna S., Anjum, Dalaver H.
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Journal:
Microscopy Research and Technique
DOI:
10.1002/jemt.23646
Date:
November, 2020
File:
PDF, 8.17 MB
2020
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