![](/img/cover-not-exists.png)
Evolution of the conductive filament with cycling in TaO x -based resistive switching devices
Ma, Yuanzhi, Yeoh, Phoebe P., Shen, Liting, Goodwill, Jonathan M., Bain, James A., Skowronski, MarekVolume:
128
Journal:
Journal of Applied Physics
DOI:
10.1063/5.0032494
Date:
November, 2020
File:
PDF, 3.37 MB
2020