Atomic-force Microscopy and Its Applications ||...

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Atomic-force Microscopy and Its Applications || High-Magnification SEM Micrograph of Siloxanes

Tański, Tomasz, Staszuk, Marcin, Ziębowicz, Bogusław
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Volume:
10.5772/in
Year:
2019
DOI:
10.5772/intechopen.82076
File:
PDF, 5.37 MB
2019
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