Atomic-force Microscopy and Its Applications || High-Magnification SEM Micrograph of Siloxanes
TaÅski, Tomasz, Staszuk, Marcin, ZiÄbowicz, BogusÅawVolume:
10.5772/in
Year:
2019
DOI:
10.5772/intechopen.82076
File:
PDF, 5.37 MB
2019