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A Secondary Reaction Pathway for the Alumina Atomic Layer Deposition Process with Trimethylaluminum and Water, Revealed by Full-Range, Time-Resolved In Situ Mass Spectrometry
Werbrouck, Andreas, Shirazi, Mahdi, Mattelaer, Felix, Elliott, Simon D., Dendooven, Jolien, Detavernier, ChristopheJournal:
The Journal of Physical Chemistry C
DOI:
10.1021/acs.jpcc.0c07602
Date:
November, 2020
File:
PDF, 4.06 MB
2020