Dual-Kernel-Based Aggregated Residual Network for Surface...

Dual-Kernel-Based Aggregated Residual Network for Surface Defect Inspection in Injection Molding Processes

Lee, Hwaseop, Ryu, Kwangyeol
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Volume:
10
Journal:
Applied Sciences
DOI:
10.3390/app10228171
Date:
November, 2020
File:
PDF, 3.27 MB
2020
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