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Characterization of ferroelectric domain walls by scanning electron microscopy
Hunnestad, K. A., Roede, E. D., van Helvoort, A. T. J., Meier, D.Volume:
128
Journal:
Journal of Applied Physics
DOI:
10.1063/5.0029284
Date:
November, 2020
File:
PDF, 3.94 MB
2020