Measuring the impact ionization and charge trapping...

Physical Review D 2020 / 2 Vol. 101; Iss. 3

Measuring the impact ionization and charge trapping probabilities in SuperCDMS HVeV phonon sensing detectors

Ponce, F., Stanford, C., Yellin, S., Page, W., Fink, C., Pyle, M., Sadoulet, B., Serfass, B., Watkins, S. L., Brink, P. L., Cherry, M., Partridge, R., Cabrera, B., Kurinsky, N., Young, B. A.
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Volume:
101
Journal:
Physical Review D
DOI:
10.1103/PhysRevD.101.031101
Date:
February, 2020
File:
PDF, 968 KB
2020
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