FATOC: Bug Isolation Based Multi-Fault Localization by...

Journal of Computer Science and Technology 2020 / 10 Vol. 35; Iss. 5

FATOC: Bug Isolation Based Multi-Fault Localization by Using OPTICS Clustering

Wu, Yong-Hao, Li, Zheng, Liu, Yong, Chen, Xiang
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Volume:
35
Journal:
Journal of Computer Science and Technology
DOI:
10.1007/s11390-020-0549-4
Date:
October, 2020
File:
PDF, 906 KB
2020
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