![](/img/cover-not-exists.png)
Light-assisted scanning probe microscopy characterization of the electrical properties of AlGaN/GaN/Si heterostructures
Szyszka, Adam, WoÅko, Mateusz, Paszkiewicz, ReginaVolume:
538
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2020.148189
Date:
February, 2021
File:
PDF, 625 KB
2021