Applications of the SESAM in Materials Science
Sigle, Wilfried, Zern, Achim, Hahn, Kersten, Krämer, Stefan, Eigenthaler, Ulrike, Rühle, ManfredVolume:
7
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927600031706
Date:
August, 2001
File:
PDF, 584 KB
2001