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Carrier localization and defect-insensitive optical behaviors of ultraviolet multiple quantum wells grown on patterned AlN nucleation layer
Chen, Li, Dai, Yijun, Li, Liang, Jiang, Jiean, Xu, Houqiang, Li, Kuang-hui, Ng, Tien Khee, Cui, Mei, Guo, Wei, Sun, Haiding, Ye, JichunJournal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2020.157589
Date:
October, 2020
File:
PDF, 1.43 MB
2020