Extrinsic Absorption Pathways in Vanadium‐Doped SiC...

physica status solidi (a) 2020 / 10 Vol. 217; Iss. 20

Extrinsic Absorption Pathways in Vanadium‐Doped SiC Measured Using a Total Internal Reflection Geometry

Kramer, Noah J., Voss, Lars F., Conway, Adam M., Grivickas, Paulius V., Bora, Mihail, Hall, David L., Caruso, Anthony N.
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Volume:
217
Journal:
physica status solidi (a)
DOI:
10.1002/pssa.202070058
Date:
October, 2020
File:
PDF, 28.11 MB
2020
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