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Method for Determining the Most Sensitive Region of an Optocoupler Chip under X-ray-Induced Dose Effects
Chernyak, M. E., Ranneva, E. V., Ulanova, A. V., Nikiforov, A. Yu., Verizhnikov, A. I., Tsyrlov, A. M., Fedosov, V. S., Shchepanov, A. N., Kalashnikov, V. D., Titovets, D. O.Volume:
48
Journal:
Russian Microelectronics
DOI:
10.1134/S1063739719060039
Date:
November, 2019
File:
PDF, 1.66 MB
2019