Method for Determining the Most Sensitive Region of an...

Russian Microelectronics 2019 / 11 Vol. 48; Iss. 6

Method for Determining the Most Sensitive Region of an Optocoupler Chip under X-ray-Induced Dose Effects

Chernyak, M. E., Ranneva, E. V., Ulanova, A. V., Nikiforov, A. Yu., Verizhnikov, A. I., Tsyrlov, A. M., Fedosov, V. S., Shchepanov, A. N., Kalashnikov, V. D., Titovets, D. O.
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Volume:
48
Journal:
Russian Microelectronics
DOI:
10.1134/S1063739719060039
Date:
November, 2019
File:
PDF, 1.66 MB
2019
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