Quantitative X-ray Channel-Cut Crystal Diffraction...

Sensors 2020 / 11 Vol. 20; Iss. 22

Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning Technique

Xue, Lian, Luo, Hongxin, Diao, Qianshun, Yang, Fugui, Wang, Jie, Li, Zhongliang
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Volume:
20
Journal:
Sensors
DOI:
10.3390/s20226660
Date:
November, 2020
File:
PDF, 5.67 MB
2020
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