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Dielectric properties investigation of a compound based on atomic layer deposited multi-layer structure
Mumlyakov, A.M., Shibalov, M.V., Trofimov, I.V., Verkholetov, M.G., Orlov, A.P., Diudbin, G.D., Evlashin, S.A., Nekludova, P.A., Anufriev, Yu.V., Tagachenkov, A.M., Zenova, E.V., Tarkhov, M.A.Journal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2020.157713
Date:
November, 2020
File:
PDF, 1.01 MB
2020