A fundamental parameter-based calibration model for an...

A fundamental parameter-based calibration model for an intrinsic germanium X-ray fluorescence spectrometer

Leif Højslet Christensen, Niels Pind
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Volume:
193
Year:
1982
Language:
english
Pages:
4
DOI:
10.1016/0029-554x(82)90680-2
File:
PDF, 288 KB
english, 1982
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