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Exploring the Capabilities of Scanning Microwave Microscopy to Characterize Semiconducting Polymers
Douhéret, Olivier, Théron, Didier, Moerman, DavidVolume:
10
Journal:
Applied Sciences
DOI:
10.3390/app10228234
Date:
November, 2020
File:
PDF, 1.31 MB
2020