In-situ characterisation of the defect density in reduced graphene oxide under electrical stress using fluorescence microscopy
Zeng, Zequn, Singh, Preetpal, Xiaodai, Sharon Lim, Tan, Cher Ming, Sow, Chorng HaurVolume:
17
Year:
2020
Journal:
International Journal of Nanotechnology
DOI:
10.1504/ijnt.2020.109350
File:
PDF, 1.62 MB
2020