Extending the near-infrared band-edge absorption spectrum...

Applied Surface Science 2021 / 02 Vol. 538

Extending the near-infrared band-edge absorption spectrum of silicon by proximity to a 2D semiconductor

Apicella, Valerio, Fasasi, Teslim Ayinde, Wong, Hon Fai, Leung, Dennis C.W., Ruotolo, Antonio
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Volume:
538
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2020.147803
Date:
February, 2021
File:
PDF, 1.95 MB
2021
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