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Effect of insulator layer thickness on electrical properties of Al/BiFeO 3 /ZrO 2 /p-Si for nonvolatile memory applications
Singh, Amit, Rai, Chandravilash, Singh, SanjaiVolume:
47
Journal:
Ferroelectrics Letters Section
DOI:
10.1080/07315171.2020.1810984
Date:
March, 2020
File:
PDF, 865 KB
2020