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Electronic properties of CoSi2 studied by reflectivity and spectroscopic ellipsometry
C. Viguier, A. Cros, A. Humbert, C. Ferrieu, O. Thomas, R. Madar, J.P. SenateurVolume:
60
Year:
1986
Language:
english
Pages:
4
DOI:
10.1016/0038-1098(86)90386-8
File:
PDF, 283 KB
english, 1986