![](/img/cover-not-exists.png)
On the gate-to-drain current ratio in junction FETs at low temperature
L.M. Rucker, E.R. Chenette, A. AmbrozyVolume:
21
Year:
1978
Language:
english
Pages:
2
DOI:
10.1016/0038-1101(78)90034-5
File:
PDF, 192 KB
english, 1978