Characterization of surface states in HCl-grown oxides...

Characterization of surface states in HCl-grown oxides using MOS transient currents

Paul D. Esqueda, Mukunda B. Das
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Volume:
23
Year:
1980
Language:
english
Pages:
11
DOI:
10.1016/0038-1101(80)90204-x
File:
PDF, 818 KB
english, 1980
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