Transconductance degradation in VVMOS power transistors due to thermal and field effects
S.W. Tarasewicz, C.A.T. SalamaVolume:
25
Year:
1982
Language:
english
Pages:
6
DOI:
10.1016/0038-1101(82)90075-2
File:
PDF, 494 KB
english, 1982