Positive charge traps in silicon dioxide films: A...

Thin Solid Films 1975 Vol. 27; Iss. 1

Positive charge traps in silicon dioxide films: A comparison of population by X-rays and band-gap light

A.G. Holmes-Siedle, I. Groombridge
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Volume:
27
Year:
1975
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(75)90019-x
File:
PDF, 335 KB
english, 1975
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