A simple method for the measurement of stress in evaporated...

Thin Solid Films 1978 Vol. 51; Iss. 3

A simple method for the measurement of stress in evaporated thin films by real-time holographic interferometry

B.S. Ramprasad, T.S. Radha
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Volume:
51
Year:
1978
Language:
english
Pages:
4
DOI:
10.1016/0040-6090(78)90296-1
File:
PDF, 480 KB
english, 1978
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