Effect of thermal expansion of the grain boundary reflection coefficient on the temperature coefficient of resistivity of thin polycrystalline films
C.R. Tellier, A.J. TosserVolume:
60
Year:
1979
Language:
english
Pages:
5
DOI:
10.1016/0040-6090(79)90351-1
File:
PDF, 196 KB
english, 1979