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Grain boundary and interdiffusion studies in compound semiconductor thin films and devices utilizing Auger electron spectroscopy and secondary ion mass spectroscopy
L.L. KazmerskiVolume:
57
Year:
1979
Language:
english
Pages:
8
DOI:
10.1016/0040-6090(79)90413-9
File:
PDF, 347 KB
english, 1979