Characterization of defect growth structrures in ion-plated...

Characterization of defect growth structrures in ion-plated films by scanning electron microscopy

Talivaldis Spalvins
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Volume:
64
Year:
1979
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(79)90553-4
File:
PDF, 991 KB
english, 1979
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