Experimental determination of electronic transport parameters in monocrystalline metallic films
C.R. Tellier, C.R. Pichard, A.J. TosserVolume:
76
Year:
1981
Language:
english
Pages:
12
DOI:
10.1016/0040-6090(81)90244-3
File:
PDF, 568 KB
english, 1981