Investigations on the quality of polysilicon film-gate...

Investigations on the quality of polysilicon film-gate dielectric interface in polysilicon thin film transistors

Ji-Ho Kung, Miltiadis K. Hatalis, Jerzy Kanicki
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
216
Year:
1992
Language:
english
Pages:
5
DOI:
10.1016/0040-6090(92)90883-d
File:
PDF, 853 KB
english, 1992
Conversion to is in progress
Conversion to is failed