Density, thickness and interface roughness of SiO2, TiO2...

Thin Solid Films 1993 Vol. 230; Iss. 2

Density, thickness and interface roughness of SiO2, TiO2 and Ta2O5 films on BK-7 glasses analyzed by x-ray reflection

Martin Hüppauff, Klaus Bange, Bruno Lengeler
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Volume:
230
Year:
1993
Language:
english
Pages:
8
DOI:
10.1016/0040-6090(93)90514-p
File:
PDF, 537 KB
english, 1993
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