![](/img/cover-not-exists.png)
Epitaxial and thermal strains in oxidic thin films on Si(001)
Th. Matthée, J. Wecker, A. Bardal, K. SamwerVolume:
258
Year:
1995
Language:
english
Pages:
4
DOI:
10.1016/0040-6090(94)06396-6
File:
PDF, 386 KB
english, 1995