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Electrical resistance drift of molybdenum silicide thin film temperature sensors
C.H. Ho, Y.H.C. Cha, S. Prakash, G. Potwin, H.J. Doerr, C.V. Deshpandey, R.F. Bunshah, M. ZellerVolume:
260
Year:
1995
Language:
english
Pages:
7
DOI:
10.1016/0040-6090(94)06453-9
File:
PDF, 795 KB
english, 1995