Influence of low energy ion bombardment on the properties of TiN films deposited by r.f. magnetron sputtering
P.Y. Jouan, G. LempérièreVolume:
237
Year:
1994
Language:
english
Pages:
8
DOI:
10.1016/0040-6090(94)90261-5
File:
PDF, 480 KB
english, 1994