Characterization of YSZ films by means of C-V measurements and TEM observations
P.E. Bagnoli, C. Ciofi, A. Diligenti, A. Innamorato, A. NanniniVolume:
264
Year:
1995
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(95)06587-3
File:
PDF, 557 KB
english, 1995